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Volumn 35, Issue 4, 2010, Pages 351-356
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A new look at resits: Are they simply a second chance?
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Author keywords
Clinical competence; Educational measurement; Resits; Standards
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Indexed keywords
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EID: 79955568702
PISSN: 02602938
EISSN: 1469297X
Source Type: Journal
DOI: 10.1080/02602931003763954 Document Type: Article |
Times cited : (12)
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References (9)
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