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Journal of Nuclear Materials

Volumn 412, Issue 3, 2011, Pages 321-326

In situ transmission electron microscopy of electron-beam induced damage process in nuclear grade graphite

(5) Karthik, C a,b Kane, J a,b Butt, D P a,b Windes, W E b,c Ubic, R a,b

a Boise State University (United States)

b UNIVERSITY OF IDAHO (United States)

c IDAHO NATIONAL LABORATORY (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC DENSITY; ATOMIC LEVELS; BASAL PLANES; CARBON RINGS; DISLOCATION CLIMB; DISLOCATION DIPOLE; IN-SITU TRANSMISSION; INDUCED DAMAGE; LATTICE IMAGES; VACANCY LOOPS;

CRACKS; ELECTRON IRRADIATION; GRAPHITE; IN SITU PROCESSING; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRONS;

EID: 79955551893 PISSN: 00223115 EISSN: None Source Type: Journal
DOI: 10.1016/j.jnucmat.2011.03.024 Document Type: Article

Times cited : (92)

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