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Volumn , Issue , 2009, Pages 89-130

X-ray Technologies

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EID: 79955551529     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1016/B978-0-12-374533-0.00006-4     Document Type: Chapter
Times cited : (11)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.