SCOPUS 정보 검색 플랫폼

Volumn 33, Issue 7, 2011, Pages 1015-1018

Site occupancy determination of Eu/Y doped in Ca2SnO4 phosphor by electron channeling microanalysis

(5) Muto, S a Fujimichi, Y a Tatsumi, K a Kawano, T b Yamane, H b

Author keywords

Electron channeling; Electron energy loss spectroscopy; Energy dispersive X ray analysis; Rare earth dopant; Transmission electron microscopy

Indexed keywords

CALCIUM COMPOUNDS; CHEMICAL BONDS; DISSOCIATION; DOPING (ADDITIVES); ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONS; ENERGY DISPERSIVE X RAY ANALYSIS; ENERGY DISSIPATION; EUROPIUM COMPOUNDS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IMPURITIES; LIGHT EMISSION; PHOSPHORS; RARE EARTHS; REFRACTORY ALLOYS; TIN COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY; X RAYS; YTTRIUM COMPOUNDS;

ATOMIC CONFIGURATION; CHEMICAL BONDING STATE; DOPANT IMPURITIES; ELECTRIC DIPOLE TRANSITION; ELECTRON CHANNELING; PHOSPHOR MATERIALS; RARE EARTH DOPANTS; RED PHOTOLUMINESCENCE;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 79955535141 PISSN: 09253467 EISSN: None Source Type: Journal
DOI: 10.1016/j.optmat.2010.09.022 Document Type: Conference Paper

Times cited : (6)

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