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Journal of Applied Physics

Volumn 109, Issue 7, 2011, Pages

Low frequency noise characteristics of submicron magnetic tunnel junctions

(5) Zhong, B a Chen, Y a,b Garzon, S a,c Crawford, T M a Webb, R A a

a UNIVERSITY OF SOUTH CAROLINA (United States)

b RUTGERS UNIVERSITY (United States)

c HITACHI AMERICA LTD (United States)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED MAGNETIC FIELDS; CHARACTERISTIC TIME; FLUCTUATORS; FREE LAYERS; LINEAR RELATION; LOW FREQUENCY; LOW-FREQUENCY NOISE; MAGNETIC TUNNEL JUNCTION; MAGNETIZATION FLUCTUATIONS; NOISE SPECTRA; REFERENCE LAYER; ROOM TEMPERATURE; SUBMICRON;

ELECTRIC RESISTANCE; MAGNETIC DEVICES; MAGNETIC FIELDS; MAGNETORESISTANCE;

TUNNEL JUNCTIONS;

EID: 79955419145 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3562039 Document Type: Conference Paper

Times cited : (6)

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