Structural and magnetic properties of NiZn-ferrite thin films prepared by radio frequency magnetron sputtering

Journal of Applied Physics

Volumn 109, Issue 7, 2011, Pages

  Liu, Yingli ^a   Li, Yuanxun ^a   Zhang, Huaiwu ^a   Chen, Daming ^a   Mu, Chunhong ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

COERCIVITIES; DEPOSITION PROCESS; FILM STRUCTURE; FILM SURFACES; GRAIN SIZE; MAGNETIC PROPERTIES OF THIN FILMS; MOLECULAR ADSORPTION; NI-ZN FERRITES; NOMINAL COMPOSITION; POLYCRYSTALLINE; POST ANNEALING; POTENTIAL APPLICATIONS; PREFERRED ORIENTATIONS; RADIO FREQUENCY MAGNETRON SPUTTERING; RESIDUAL OXYGEN; RF-MAGNETRON SPUTTERING; SI (100) SUBSTRATE; SPUTTERING PRESSURES; STRUCTURAL AND MAGNETIC PROPERTIES; SUBSTRATE CONDITIONS;

ADSORPTION; ATOMIC FORCE MICROSCOPY; FERRITE; FERRITES; FILM THICKNESS; MAGNETIC PROPERTIES; MAGNETRON SPUTTERING; MOLECULAR OXYGEN; SEMICONDUCTING SILICON COMPOUNDS; THIN FILMS; VAPOR DEPOSITION;

SATURATION MAGNETIZATION;

EID: 79955385656     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3556775     Document Type: Conference Paper

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