PIXE analysis of Middle European 18th and 19th century glass seals

X-Ray Spectrometry

Volumn 40, Issue 3, 2011, Pages 224-228

  Simon, Alíz ^a   Matiskainen, Heikki ^b   Uzonyi, Imre ^a   Csedreki, László ^a   Szikszai, Zita ^a   Kertész, Zsófia ^a   Räisänen, Jyrki ^c   Kiss, Árpád Z ^a  

^a INSTITUTE OF NUCLEAR RESEARCH ATOMKI   (Hungary)

^b The Finnish Glass Museum   (Finland)

^c UNIVERSITY OF HELSINKI   (Finland)

Author keywords

[No Author keywords available]

Indexed keywords

ENERGY DISPERSIVE SPECTROSCOPY; GAMMA RAYS; GLASS; ION BEAMS; TRACE ELEMENTS;

18TH CENTURY; 19TH CENTURY; ARCHAEOLOGICAL GLASS; ELEMENTAL COMPOSITIONS; EMISSION METHOD; GLASS SEALS; MAJOR ELEMENTS; PARTICLE INDUCED X-RAY EMISSION; PIXE ANALYSIS; QUANTITATIVE INFORMATION;

DISCRIMINANT ANALYSIS;

EID: 79955152485     PISSN: 00498246     EISSN: 10974539     Source Type: Journal    
DOI: 10.1002/xrs.1328     Document Type: Article

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