Depairing critical current achieved in superconducting thin films with through-thickness arrays of artificial pinning centers

Superconductor Science and Technology

Volumn 24, Issue 5, 2011, Pages

  Dinner, Rafael B ^a,b   Robinson, Adam P ^a   Wimbush, Stuart C ^a   MacManus Driscoll, Judith L ^a   Blamire, Mark G ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b ARETÉ ASSOCIATES   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANODIZATION TIME; ANODIZED ALUMINUM OXIDE; APPLIED FIELD; ARTIFICIAL PINNING CENTERS; AS-DEPOSITED FILMS; FIELD DEPENDENCE; FLUX PINNING CENTERS; GINZBURG-LANDAU; LARGE AREA ARRAYS; MAGNETIC ATTRACTION; MAGNETIC INCLUSIONS; MAGNETIC PINNING; MATCHING FIELDS; MILLING TIME; NANO-SCALE PORES; NB FILM; PORE DENSITIES; PROCESS CONDITION; SUPERCONDUCTING CRITICAL CURRENT; SUPERCONDUCTING THIN FILM;

FILM THICKNESS; FLUX PINNING; MAGNETIC MATERIALS; MAGNETISM; OXIDE FILMS; POINT DEFECTS; SUPERCONDUCTIVITY; THIN FILMS;

SUPERCONDUCTING FILMS;

EID: 79955018526     PISSN: 09532048     EISSN: 13616668     Source Type: Journal    
DOI: 10.1088/0953-2048/24/5/055017     Document Type: Article

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