|
Volumn 23, Issue 17, 2011, Pages
|
Local structural properties of CuI at low temperatures
|
Author keywords
[No Author keywords available]
|
Indexed keywords
EXAFS;
EXTENDED X-RAY ABSORPTION FINE STRUCTURE MEASUREMENTS;
LOCAL STRUCTURAL PROPERTIES;
LOW TEMPERATURES;
MAXIMUM ENTROPY METHODS;
META-STABLE STATE;
MODEL FIT;
XRD;
ZINC-BLENDE;
CRYSTAL STRUCTURE;
RIETVELD METHOD;
RIETVELD REFINEMENT;
X RAY DIFFRACTION;
ZINC;
STRUCTURAL PROPERTIES;
|
EID: 79955015031
PISSN: 09538984
EISSN: 1361648X
Source Type: Journal
DOI: 10.1088/0953-8984/23/17/175402 Document Type: Article |
Times cited : (11)
|
References (26)
|