Analytical expressions for transient diffusion layer thicknesses at non uniformly accessible electrodes

Electrochimica Acta

Volumn 56, Issue 12, 2011, Pages 4589-4594

  Molina, A ^a   Gonzalez, J ^a   Henstridge, M C ^b   Compton, R G ^b  

^a UNIVERSITY OF MURCIA   (Spain)

^b UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

Band; Constant current chronoamperometry; Diffusion layer thickness; Disk; Linear Sweep Voltammetry; Microelectrode

Indexed keywords

BAND; CONSTANT CURRENT; DIFFUSION LAYER THICKNESS; DISK; LINEAR SWEEP VOLTAMMETRY;

CHRONOAMPEROMETRY; MICROELECTRODES; SURFACE DEFECTS; VOLTAMMETRY;

DIFFUSION;

EID: 79954618003     PISSN: 00134686     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.electacta.2011.02.085     Document Type: Article

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