The ferroelectric and ferromagnetic characterization of CoFe 2 O 4 /Pb(Mg 1/3 Nb 2/3 )O 3 -PbTiO 3 multilayered thin films

Applied Surface Science

Volumn 257, Issue 15, 2011, Pages 6573-6576

  Guo, Hong Li ^a   Liu, Guo ^a   Li, Xue Dong ^a   Li, Hai Min ^a   Zhang, Wan Li ^b   Zhu, Jian Guo ^a   Xiao, Ding Quan ^a  

^a SICHUAN UNIVERSITY   (China)

^b UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Ferroelectric thin films; rf magnetron sputtering; RTA

Indexed keywords

CRYSTAL ATOMIC STRUCTURE; CRYSTALLITE SIZE; FERROELECTRIC FILMS; FERROELECTRIC THIN FILMS; FERROELECTRICITY; FERROMAGNETIC MATERIALS; FERROMAGNETISM; LEAD TITANATE; MAGNETRON SPUTTERING; RAPID THERMAL ANNEALING; SILICA; X RAY DIFFRACTION;

ATOM FORCE MICROSCOPY (AFM); CRYSTALLITE ORIENTATION; FERROMAGNETIC PROPERTIES; MULTILAYERED THIN FILMS; RF MAGNETRON SPUTTERING METHOD; RF-MAGNETRON SPUTTERING; ROOT MEAN SQUARE ROUGHNESS; THIN FILMS-THICKNESS;

THIN FILMS;

EID: 79954616376     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2011.02.080     Document Type: Article

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