AFM improves resolution of IR spectroscopy

Laser Focus World

Volumn 47, Issue 3, 2011, Pages 52-54

  Prater, Craig ^a   Kjoller, Kevin ^a   Shetty, Roshan ^a   Dazzi, Alexandre ^b  

^a Anasys Instruments   (United States)

^b UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION BAND; AFM; ATOMIC FORCE MICROSCOPES; ATTENUATED TOTAL REFLECTANCE SPECTROSCOPY; FOURIER TECHNIQUES; IR ABSORPTION; IR LASERS; IR MICRO-SPECTROSCOPY; IR SOURCE; IR SPECTROSCOPY; MECHANICAL STIFFNESS; OSCILLATION FREQUENCY; SINGLE WAVELENGTH; TOTAL INTERNAL REFLECTIONS;

ABSORPTION; MECHANICAL PROPERTIES; MULTILAYER FILMS; OPTICAL PARAMETRIC OSCILLATORS; PARAMETRIC OSCILLATORS; REFRACTIVE INDEX; SURFACE TOPOGRAPHY;

ATOMIC FORCE MICROSCOPY;

EID: 79954592068     PISSN: 10438092     EISSN: None     Source Type: Trade Journal    
DOI: None     Document Type: Article

References (11)

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9. J. Houel, E. Homeyer, S. Sauvage, P. Boucaud, A. Dazzi et al., "Mid-IR absorption measured at Lambda/400 resolution with AFM," Opt. Exp., 17, 13, 10887-10894 (2009).
10. A. Dazzi, chapter on AFMIR technique and applications, in Biomedical Vibrational Spectroscopy, P. Lasch and J. Kneipp, ed., Wiley (April 2008).
11. A. Dazzi, R. Prazeres, F. Glotin, and M. Ortega, "Subwavelength infrared spectromicroscopy using an AFM as a local absorption sensor," Infrared Phys. and Technol., 49, 113-121 (2006).