Spectromicroscopy with low-energy electrons: LEEM and XPEEM studies at the nanoscale

e-Journal of Surface Science and Nanotechnology

Volumn 9, Issue , 2011, Pages 72-79

  Menteş, Tevfik Onur ^a   Nino, Miguel Angel ^a,b   Locatelli, Andrea ^a  

^a SINCROTRONE TRIESTE   (Italy)

^b INSTITUTO MADRILEÑO DE ESTUDIOS AVANZADOS EN NANOCIENCIA IMDEA NANOCIENCIA   (Spain)

Author keywords

Graphene; LEED; LEEM; XPEEM

Indexed keywords

CRYSTALLOGRAPHY; ELECTRONS; ENVIRONMENTAL DESIGN; GRAPHENE; TUNGSTEN;

ANALYTICAL CHARACTERIZATION; INELASTICALLY SCATTERED; LEEM; LOW ENERGY ELECTRON MICROSCOPES; MULTI-TECHNIQUE APPROACH; NANOSPECTROSCOPY BEAMLINE; SPIN REORIENTATION TRANSITIONS; XPEEM;

SINGLE CRYSTAL SURFACES;

EID: 79954532645     PISSN: None     EISSN: 13480391     Source Type: Journal    
DOI: 10.1380/ejssnt.2011.72     Document Type: Conference Paper

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