Scanning photoelectron microscopy: A powerful technique for probing micro and nano-structures*

e-Journal of Surface Science and Nanotechnology

Volumn 9, Issue , 2011, Pages 158-162

  Abyaneh, Majid Kazemian ^a   Gregoratti, Luca ^a   Amati, Matteo ^a   Dalmiglio, Matteo ^a   Kiskinova, Maya ^a  

^a SINCROTRONE TRIESTE   (Italy)

Author keywords

Multi wall carbon nanotube; Scanning photoelectron microscopy (SPEM); Spectromicroscopy; XPS

Indexed keywords

BINARY ALLOYS; II-VI SEMICONDUCTORS; NANOPARTICLES; PHOTOELECTRON SPECTROSCOPY; PHOTOELECTRONS; PHOTONS; PLATINUM ALLOYS; PROBES; PULSED LASER DEPOSITION; RHODIUM ALLOYS; SCANNING; X RAY PHOTOELECTRON SPECTROSCOPY; YARN; ZINC OXIDE;

CHEMICAL COMPOSITIONS; MICRO AND NANO-PARTICLE; MICRO AND NANOSTRUCTURES; OXIDATION/REDUCTION; SCANNING PHOTOELECTRON MICROSCOPY; SHARP INTERFACE; SPECTROMICROSCOPY; ZNO NANOSTRUCTURES;

MULTIWALLED CARBON NANOTUBES (MWCN);

EID: 79954497901     PISSN: None     EISSN: 13480391     Source Type: Journal    
DOI: 10.1380/ejssnt.2011.158     Document Type: Article

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