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Thin Solid Films

Volumn 519, Issue 13, 2011, Pages 4277-4281

Photoelectrochemical properties of anodic silver sulphide thin films

(3) Omeiri, S a,b Hadjarab, B b Trari, M b

a CENTRE DE RECHERCHE SCIENTIFIQUE ET TECHNIQUE EN ANALYSES PHYSICO CHIMIQUES CRAPC (Algeria)

b UNIVERSITY OF SCIENCES AND TECHNOLOGY HOUARI BOUMEDIENE (Algeria)

Author keywords

Anodic oxidation; Electrochemistry; Optoelectronic devices; Semiconductors; Silver sulphide

Indexed keywords

BAND GAPS; BULK EFFECT; CONSTANT PHASE ELEMENT; DONOR DENSITY; EXPERIMENTAL DATA; FILL FACTOR; FLAT BAND POTENTIAL; HIGH CURRENT DENSITIES; INHOMOGENEITIES; LINEAR BEHAVIOR; LOW CURRENT DENSITY; MOTT-SCHOTTKY PLOTS; N-TYPE CONDUCTIVITY; OPTIMAL THICKNESS; OXYGEN EVOLUTION; PHOTOELECTROCHEMICAL CHARACTERIZATION; PHOTOELECTROCHEMICAL MEASUREMENTS; PHOTOELECTROCHEMICAL PROPERTIES; REDOX COUPLE; S THIN FILMS; SEMI-CONDUCTING PROPERTY; SEMICONDUCTORS; SILVER SUBSTRATE; SILVER SULPHIDE; WIDE FREQUENCY RANGE;

ANODIC OXIDATION; CONVERSION EFFICIENCY; ELECTROCHEMICAL CORROSION; ELECTROCHEMICAL IMPEDANCE SPECTROSCOPY; ELECTRON MOBILITY; ELECTROOPTICAL DEVICES; OPTOELECTRONIC DEVICES; OXYGEN; THIN FILMS;

SILVER;

EID: 79954431505 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2011.02.001 Document Type: Article

Times cited : (19)

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