Studies on electrodeposited silver sulphide thin films by double exposure holographic interferometry

Applied Surface Science

Volumn 255, Issue 5 PART 1, 2008, Pages 1819-1823

  Prabhune, V B ^a   Shinde, N S ^a   Fulari, V J ^a  

^a SHIVAJI UNIVERSITY   (India)

Author keywords

Double exposure holographic interferometry (DEHI) technique; Electrodeposition; Optical absorption; Silver sulphide; X ray diffraction

Indexed keywords

CORROSION; CRYSTAL STRUCTURE; CYCLIC VOLTAMMETRY; ELECTRODEPOSITION; ELECTRODES; ETHYLENE; ETHYLENEDIAMINETETRAACETIC ACID; HOLOGRAPHIC INTERFEROMETRY; LIGHT ABSORPTION; NANOCOMPOSITES; OPTICAL PROPERTIES; OXIDE FILMS; SODIUM COMPOUNDS; SUBSTRATES; SULFUR COMPOUNDS; THIN FILMS; TIN OXIDES; X RAY DIFFRACTION;

DOUBLE EXPOSURE HOLOGRAPHIC INTERFEROMETRIES; DOUBLE EXPOSURE HOLOGRAPHIC INTERFEROMETRY TECHNIQUES; ELECTRODEPOSITION PROCESS; MONOCLINIC CRYSTAL STRUCTURE; OPTICAL ABSORPTION STUDIES; OPTICAL ABSORPTION TECHNIQUES; SILVER SULPHIDE; STRUCTURAL AND OPTICAL PROPERTIES;

SILVER COMPOUNDS;

EID: 56949102794     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.06.022     Document Type: Article

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