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Thin Solid Films

Volumn 519, Issue 13, 2011, Pages 4390-4393

Raman spectroscopy of CuIn1 - XGaxSe2 for in-situ monitoring of the composition ratio

(1) Choi, In Hwan a

a Chung Ang University (South Korea)

Author keywords

Copper indium diselenide; Copper indium gallium diselenide; Metal organic chemical vapor deposition; Raman spectroscopy

Indexed keywords

1-BUTENE; ABSORBER LAYERS; CIGS THIN FILMS; COMPOSITION RATIO; COPPER INDIUM DISELENIDE; COPPER INDIUM GALLIUM DISELENIDE; HIGH QUALITY; IN-SITU; IN-SITU MONITORING; METAL ORGANIC; METAL ORGANIC CHEMICAL VAPOR DEPOSITION; MOCVD; NON-CONTACT MONITORING; RAMAN SHIFT; SINGLE SOURCE; TRIMETHYL GALLIUM;

BUTENES; COPPER COMPOUNDS; GALLIUM; INDIUM; INDUSTRIAL CHEMICALS; METALLORGANIC CHEMICAL VAPOR DEPOSITION; ORGANIC CHEMICALS; ORGANOMETALLICS; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SEMICONDUCTING SELENIUM COMPOUNDS; THIN FILMS; VAPOR DEPOSITION;

COPPER;

EID: 79954426878 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2011.02.058 Document Type: Article

Times cited : (53)

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