Reliability of 4.6-μm quantum cascade lasers under continuous-wave room-temperature operation

Optical Engineering

Volumn 49, Issue 11, 2010, Pages

  Xie, Feng ^a   Caneau, Catherine G ^a   Leblanc, Herve P ^a   Page, Christopher A ^a   Chaparala, Satish ^a   Deichmann, Oberon D ^a   Hughes, Lawrence C ^a   Zah, Chung En ^a  

^a Corning Incorporated ^*  (United States)

Author keywords

indium phosphide; midinfrared; quantum cascade lasers; reliability

Indexed keywords

AGING CONDITIONS; AU-SN SOLDER; CONSTANT CURRENT; CONTINUOUS WAVE OPERATION; CONTINUOUS WAVES; FACET COATING; LIFE-TESTS; METALORGANIC VAPOR PHASE EPITAXY; MIDINFRARED; PLANAR-BURIED HETEROSTRUCTURE; QUANTUM CASCADES; ROOM-TEMPERATURE OPERATION; SINK TEMPERATURE; STRAIN-BALANCED;

INDIUM; INDIUM PHOSPHIDE; METALLORGANIC VAPOR PHASE EPITAXY; ORGANIC LASERS; ORGANOMETALLICS; QUANTUM CASCADE LASERS; RELIABILITY;

CONTINUOUS WAVE LASERS;

EID: 79953881931     PISSN: 00913286     EISSN: 15602303     Source Type: Journal    
DOI: 10.1117/1.3498776     Document Type: Article

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