Toward a BITE for real time MTTF estimation of capacitors

2010 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2010 - Proceedings

Volumn , Issue , 2010, Pages 437-442

  Albertini, Andrea ^a   Masi, Maria Gabriella ^a   Mazzanti, Giovanni ^a   Peretto, Lorenzo ^a   Tinarelli, Roberto ^a  

^a UNIVERSITY OF BOLOGNA   (Italy)

Author keywords

Arrhenius model; Capacitor; Constant thermal stress; Time varying thermal stress

Indexed keywords

ARRHENIUS MODELS; CONSTANT THERMAL STRESS; LIFE MODELS; MEASUREMENT CAMPAIGN; MODEL DEVELOPMENT; PAST AND PRESENT; REAL TIME; REAL-TIME DIAGNOSTICS; TEST SYSTEMS; TIME TO FAILURE; TIME VARYING;

CAPACITORS; INSTRUMENTS; MEASUREMENT THEORY; THERMOELASTICITY; TIME VARYING SYSTEMS;

THERMAL STRESS;

EID: 77957837268     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IMTC.2010.5488065     Document Type: Conference Paper

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