Structural characterization of surfactant-coated bimetallic cobalt/nickel nanoclusters by XPS, EXAFS, WAXS, and SAXS

Journal of Physical Chemistry C

Volumn 115, Issue 14, 2011, Pages 6360-6366

  Sciortino, Luisa ^a   Giannici, Francesco ^a   Martorana, Antonino ^a   Ruggirello, Angela Monia ^a   Liveri, Vincenzo Turco ^a   Portale, Giuseppe ^b   Casaletto, Maria Pia ^c   Longo, Alessandro ^c  

^a UNIVERSITY OF PALERMO   (Italy)

^b Netherlands Organization for Scientific Research (NWO)   (France)

^c CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC SCALE; BIMETALLIC NANOPARTICLES; CHEMICAL AFFINITIES; CHEMICAL REDUCTION; COATED NANOPARTICLES; COBALT-NICKEL; DATA ANALYSIS; EXAFS; GROWING PROCESS; INTERNAL STRUCTURE; MATRIX; MOLAR RATIO; N-HEPTANES; NANOPARTICLE SURFACE; PHYSICOCHEMICAL PROCESS; REDUCTANTS; SODIUM BIS(2-ETHYLHEXYL) PHOSPHATE (NADEHP); SODIUM BOROHYDRIDES; STRUCTURAL CHARACTERIZATION; STRUCTURAL FEATURE; SURFACTANT ADSORPTION; XPS;

ADSORPTION; COBALT; DATA REDUCTION; ETHANOL; HEPTANE; SURFACE ACTIVE AGENTS; X RAY PHOTOELECTRON SPECTROSCOPY;

NANOPARTICLES;

EID: 79953751651     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp200288y     Document Type: Article

References (25)

1. Chen, W.; Ghosh, D.; Sun, J.; Tong, M. C.; Deng, F.; Chen, S. Electrochim. Acta 2007, 53, 1150
2. Mirkhalaf, F.; Paprotny, J.; Schiffrin, D. J. J. Am. Chem. Soc. 2006, 128, 7400
3. Joseph, Y.; Besnard, I.; Rosenberger, M.; Guse, B.; Nothofer, H. G.; Wessels, J. M.; Wild, U.; Knop-Gericke, A.; Su, D.; Schlo1gl, R.; Yasuda, A.; Vossmeyer, T. J. Phys. Chem. B 2003, 107, 7406
4. Zhang, H.; Yao, T.; Sun, Z.; Li, Y.; Liu, Q.; Hu, F.; Pan, Z.; He, B.; Xie, Z.; Wei, S. J. Phys. Chem. C 2010, 114 (32) 13596-13600
5. Hu, M. J.; Lu, Y; Zhang, S.; Guo, S. R.; Lin, B.; Zhang, M.; Yu, S. H. J. Am. Chem. Soc. 2008, 130 (35) 11606-11607
6. Yao, H.; Kurokami, M.; Kimura, K. Microelectron. Eng. 2009, 86, 809
7. Dong, T. Y.; Wu, H. H.; Lin, M. C. Langmuir 2006, 22, 6754
8. Longo, A.; Giordano, F.; Giannici, F.; Martorana, A.; Portale, G.; Ruggirello, A.; Turco Liveri, V. J. Appl. Phys. 2009, 105, 114308
9. Ang, T. P.; Chin, W. S. J. Phys. Chem. B 2005, 109, 22228-22236
10. Cheng, G.; Hight Walker, A. R. J. Magn. Magn. Mater. 2007, 311, 31
11. Turco Liveri, V. Controlled Synthesis of Nanoparticles in Microheterogeneous Systems; Kluwer Academic/Plenum Publishers: New York, 2005.
12. Longo, A.; Portale, G.; Bras, W.; Giannici, F.; Ruggirello, A. M.; Turco Liveri, V. Langmuir 2007, 23, 11482
13. Yamauchi, T.; Tsukahara, Y.; Yamada, K.; Sakata, T.; Wada, Y. Chem. Mater. 2011, 23, 75
14. Steyler, D. C.; Jenta, T. R.; Robinson, B. H.; Eastoe, J.; Heenan, R. H. Langmuir 1996, 12, 1483
15. Shirley, D. A. Phys. Rev. B 1972, 5, 4709
16. Sherwood, P. M. A.; Briggs, D.; Seah, M. P. Practical Surface Analysis; Wiley: New York, 1990; p 181.
17. Wagner, C. D.; Davis, L. E.; Riggs, W. M. Surf. Interface Anal. 1986, 2, 53
18. Klementev, K. V. J. Phys. D: Appl. Phys. 2001, 34, 209
19. Moulder, J. F.; Stickle, W. F.; Sobol, P. E.; Bomben, K. D. In Handbook of X-Ray Photoelectron Spectroscopy; Chastain, J.; King, R. C., Jr., Eds.; Physical Electronics Inc.: Eden Prairie, MN, 1995.
20. Tan, B. J.; Klabunde, K. J.; Sherwood, P. M. A. J. Am. Chem. Soc. 1991, 113 (3) 855
21. Borowski, M. J. Phys. IV 1997, 7, C2-259-C2-260
22. Kitakami, O.; Sato, H.; Shimada, Y.; Sato, F.; Tanaka, M. Phys. Rev. B 1997, 56, 13849
23. Cattaruzza, E.; Battaglin, G.; Canton, P.; de Julián Fernández, C.; Ferroni, M.; Finotto, T.; Maurizio, C.; Sada, C. J. Non-Cryst. Solids 2004, 336, 148
24. Longo, A.; Martorana, A. J. Appl. Crystallogr. 2008, 41, 446
25. Pileni, M. P. Langmuir 1997, 13, 3266-3276