SCOPUS 정보 검색 플랫폼

Surface and Interface Analysis

Volumn 43, Issue 5, 2011, Pages 884-892

Characterization of β-cyclodextrin modified SiO2

(5) Nielsen, Ronnie a Kingshott, Peter b Uyar, Tamer b Hacaloglu, Jale c Larsen, Kim L a

a AALBORG UNIVERSITY (Denmark)

b AARHUS UNIVERSITY (Denmark)

c MIDDLE EAST TECHNICAL UNIVERSITY (Turkey)

Author keywords

cyclodextrin; DP MS; elemental analysis; RAMAN; TGA; XPS; XRD

Indexed keywords

DP-MS; ELEMENTAL ANALYSIS; RAMAN; TGA; XPS; XRD;

CRACKING (CHEMICAL); CYCLODEXTRINS; MASS SPECTROMETRY; SILANES; SILICA; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL ANALYSIS;

EID: 79953704791 PISSN: 01422421 EISSN: 10969918 Source Type: Journal
DOI: 10.1002/sia.3650 Document Type: Article

Times cited : (19)

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