Electron Beam-Induced Current (EBIC) in solution-processed solar cells

Scanning

Volumn 33, Issue 1, 2011, Pages 1-6

  Reuter, Piet ^a   Rath, Thomas ^b   Fischereder, Achim ^b   Trimmel, Gregor ^b   Hadley, Peter ^a  

^a GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

^b GRAZ UNIVERSITY OF TECHNOLOGY   (Austria)

Author keywords

EBIC; Failure analysis; Radiation damage; SEM; Solution processed solar cells

Indexed keywords

ACTIVE LAYER; CELL OPERATION; EBIC; ELECTRON HOLE PAIRS; ELECTRON-BEAM-INDUCED CURRENT; ORGANIC MATERIALS; SCAN AREA; SCANNING ELECTRON MICROSCOPE; SEM; SMALL AREA; SOLUTION-PROCESSED; SOLUTION-PROCESSED SOLAR CELLS;

ELECTRON BEAMS; ELECTRON OPTICS; ELECTRONS; FAILURE ANALYSIS; QUALITY ASSURANCE; RADIATION DAMAGE; SCANNING ELECTRON MICROSCOPY;

SOLAR CELLS;

ARTICLE; ELECTRIC POTENTIAL; ELECTRON BEAM; PRIORITY JOURNAL; RADIATION INJURY; SCANNING ELECTRON MICROSCOPY;

EID: 79953684273     PISSN: 01610457     EISSN: 19328745     Source Type: Journal    
DOI: 10.1002/sca.20222     Document Type: Article

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