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Volumn 605, Issue 9-10, 2011, Pages 972-976
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STM characterization of size-selected V1, V2, VO, and VO2 clusters on a TiO2(110)-(1 × 1) surface at room temperature
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Author keywords
Clusters; Scanning tunneling microscopy; Surface structure, morphology, roughness, and topography; Titanium oxide; Vanadium; Vanadium oxide
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Indexed keywords
ATOMIC LEVELS;
CLUSTERS;
GAS-PHASE STRUCTURES;
HOLLOW SITES;
OXYGEN ATOM;
ROOM TEMPERATURE;
RUTILE TIO;
SOFT LANDING;
SURFACE STRUCTURE, MORPHOLOGY, ROUGHNESS, AND TOPOGRAPHY;
TI ATOMS;
TIO;
UHV-STM;
VANADIUM OXIDE;
ATOMS;
OXIDE MINERALS;
OXYGEN;
SCANNING;
SCANNING TUNNELING MICROSCOPY;
SURFACE ROUGHNESS;
TITANIUM;
TITANIUM OXIDES;
TOPOGRAPHY;
VANADIUM;
VANADIUM ALLOYS;
VANADIUM COMPOUNDS;
SURFACE MORPHOLOGY;
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EID: 79953272267
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2011.02.016 Document Type: Article |
Times cited : (26)
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References (26)
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