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Organic Process Research and Development

Volumn 12, Issue 4, 2008, Pages 646-654

Interpretation of focused beam reflectance measurement (FBRM) data via simulated crystallization

(3) Yu, Zai Qun a Chow, Pui Shan a Tan, Reginald B H a,b

a INSTITUTE OF CHEMICAL AND ENGINEERING SCIENCES (Singapore)

b NATIONAL UNIVERSITY OF SINGAPORE (Singapore)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 58149173304 PISSN: 10836160 EISSN: 1520586X Source Type: Journal
DOI: 10.1021/op800063n Document Type: Article

Times cited : (55)

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