Capillary force between wetted nanometric contacts and its application to atomic force microscopy

Langmuir

Volumn 27, Issue 7, 2011, Pages 3468-3473

  Crassous, Jérôme ^a   Ciccotti, Matteo ^b,d   Charlaix, Elisabeth ^c  

^a UNIVERSITÉ DE RENNES 1   (France)

^b UNIVERSITÉ MONTPELLIER 2   (France)

^c UNIVERSITÉ LYON 1   (France)

^d Centre National de la Recherche Scientifique   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; LIQUID FILMS; VAN DER WAALS FORCES;

APPROXIMATE ANALYTICAL EXPRESSIONS; EXACT CALCULATIONS; ITS APPLICATIONS; MATHEMATICAL DESCRIPTIONS; PULL-OFF FORCES; SATURATION VALUES; VAN DER WAALS INTERACTIONS; WETTING LIQUID FILMS;

WETTING;

EID: 79953238519     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la103781y     Document Type: Article

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