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Volumn 509, Issue 16, 2011, Pages 5070-5074
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Ferroelectric relaxor behavior and dielectric spectroscopic study of 0.99(Bi0.5Na0.5TiO3)-0.01(SrNb 2O6) solid solution
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Author keywords
Crystal structure; Dielectric response; Ferroelectrics; X ray diffraction
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Indexed keywords
COLE-COLE PLOTS;
CURIE WEISS LAW;
DIELECTRIC CONSTANTS;
DIELECTRIC DATA;
DIELECTRIC DISPERSION;
DIELECTRIC RESPONSE;
DIFFUSE PHASE TRANSITIONS;
FERROELECTRIC RELAXOR BEHAVIOR;
FERROELECTRICS;
FREEZING TEMPERATURES;
FREQUENCY DEPENDENT;
HEXAGONAL UNIT CELLS;
HIGHER TEMPERATURES;
LOW FREQUENCY;
PEROVSKITE PHASE;
RELAXATION DISTRIBUTION;
RELAXOR BEHAVIOR;
SOLID STATE REACTION ROUTE;
SPECTROSCOPIC STUDIES;
TEMPERATURE DEPENDENT;
TIO;
VOGEL-FULCHER;
DIELECTRIC RELAXATION;
DIFFRACTION;
FERROELECTRIC MATERIALS;
LATTICE CONSTANTS;
PERMITTIVITY;
PEROVSKITE;
PHASE TRANSITIONS;
POLYDISPERSITY;
SINGLE CRYSTALS;
SINTERING;
SODIUM;
SOLID STATE REACTIONS;
SPECTROSCOPIC ANALYSIS;
X RAY DIFFRACTION;
CRYSTAL STRUCTURE;
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EID: 79953041287
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2010.12.195 Document Type: Article |
Times cited : (8)
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References (42)
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