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Volumn 472, Issue 1-2, 2009, Pages 267-270
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Piezoelectric and dielectric properties of CeO2-doped (Bi0.5Na0.5)0.94Ba0.06TiO3 lead-free ceramics
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Author keywords
Ceramics; Electronic properties; Piezoelectricity; Solid state reaction; X ray diffraction
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Indexed keywords
BARIUM;
CERAMIC CAPACITORS;
CRYSTALLOGRAPHY;
DIELECTRIC WAVEGUIDES;
DIFFRACTION;
ELECTRIC PROPERTIES;
ELECTRONIC PROPERTIES;
OXIDE MINERALS;
PERMITTIVITY;
PEROVSKITE;
PIEZOELECTRIC CERAMICS;
PIEZOELECTRIC TRANSDUCERS;
PYROELECTRICITY;
SODIUM;
X RAY DIFFRACTION;
X RAY DIFFRACTION ANALYSIS;
ANTIFERROELECTRIC;
CERAMICS;
COUPLING FACTORS;
DIELECTRIC AND PIEZOELECTRIC PROPERTIES;
DIELECTRIC CONSTANTS;
DISSIPATION FACTORS;
DOPED SAMPLES;
ELECTRICAL PROPERTIES;
HIGH DIELECTRIC CONSTANTS;
HIGH PIEZOELECTRIC CONSTANTS;
LEAD-FREE CERAMICS;
LEAD-FREE PIEZOELECTRIC CERAMICS;
MECHANICAL QUALITY FACTORS;
PIEZOELECTRIC PROPERTIES;
PLANAR COUPLING FACTORS;
PURE PEROVSKITE PHASE;
ROOM TEMPERATURES;
SEM IMAGES;
SOLID-STATE PROCESS;
SOLID-STATE REACTION;
TEMPERATURE DEPENDENCES;
TRANSITION TEMPERATURES;
PIEZOELECTRICITY;
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EID: 61349095449
PISSN: 09258388
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jallcom.2008.04.038 Document Type: Article |
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Times cited : (61)
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References (22)
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