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Volumn 13, Issue 4, 2011, Pages 745-749
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Hierarchical porous materials: Internal structure revealed by argon ion-beam cross-section polishing, HRSEM and AFM
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Author keywords
Atomic force microscopy; Cross section polishing; Hierarchical porous materials; High resolution scanning electron microscopy
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Indexed keywords
AFM;
ARGON ION;
ARGON ION BEAM;
BEAM CROSS-SECTION;
CROSS SECTION;
CROSS-SECTION POLISHING;
DIRECT IMAGING;
HIERARCHICAL POROUS MATERIALS;
HIGH RESOLUTION SCANNING ELECTRON MICROSCOPY;
HIGH-RESOLUTION SCANNING ELECTRON MICROSCOPIES;
INTERCONNECTIVITY;
INTERNAL STRUCTURE;
LATEX SPHERES;
MACRO-POROSITY;
MACROPOROUS;
MESOPHASES;
MESOPOROSITY;
MESOPOROUS;
MESOPOROUS NETWORK;
ORGANIC TEMPLATING;
POLYMER CHAINS;
STRUCTURAL DAMAGES;
ARGON;
ATOMIC FORCE MICROSCOPY;
ELECTRONS;
ION BEAMS;
IONS;
MICROPOROSITY;
POLISHING;
POLYMERS;
POROUS MATERIALS;
SCANNING;
SCANNING ELECTRON MICROSCOPY;
SILICA;
HIGH RESOLUTION ELECTRON MICROSCOPY;
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EID: 79953037829
PISSN: 12932558
EISSN: None
Source Type: Journal
DOI: 10.1016/j.solidstatesciences.2010.04.027 Document Type: Article |
Times cited : (9)
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References (10)
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