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Volumn 13, Issue 4, 2011, Pages 745-749

Hierarchical porous materials: Internal structure revealed by argon ion-beam cross-section polishing, HRSEM and AFM

Author keywords

Atomic force microscopy; Cross section polishing; Hierarchical porous materials; High resolution scanning electron microscopy

Indexed keywords

AFM; ARGON ION; ARGON ION BEAM; BEAM CROSS-SECTION; CROSS SECTION; CROSS-SECTION POLISHING; DIRECT IMAGING; HIERARCHICAL POROUS MATERIALS; HIGH RESOLUTION SCANNING ELECTRON MICROSCOPY; HIGH-RESOLUTION SCANNING ELECTRON MICROSCOPIES; INTERCONNECTIVITY; INTERNAL STRUCTURE; LATEX SPHERES; MACRO-POROSITY; MACROPOROUS; MESOPHASES; MESOPOROSITY; MESOPOROUS; MESOPOROUS NETWORK; ORGANIC TEMPLATING; POLYMER CHAINS; STRUCTURAL DAMAGES;

EID: 79953037829     PISSN: 12932558     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.solidstatesciences.2010.04.027     Document Type: Article
Times cited : (9)

References (10)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.