Nanoparticulate Pd supported catalysts: Size-dependent formation of Pd(I)/Pd(0) and their role in CO elimination

Journal of the American Chemical Society

Volumn 133, Issue 12, 2011, Pages 4484-4489

  Iglesias Juez, Ana ^a   Kubacka, Anna ^a   Fernández García, Marcos ^a   Di Michiel, Marco ^b   Newton, Mark A ^b  

^a INSTITUTO DE CATÁLISIS Y PETROLEOQUÍMICA   (Spain)

^b EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE SPECIES; CATALYTIC PERFORMANCE; CYCLING CONDITIONS; DIFFUSE REFLECTANCE INFRARED SPECTROSCOPY; HARD X RAY; MULTI-TECHNIQUE APPROACH; NANO PARTICULATES; NOBLE METALS; PD NANO PARTICLE; PD-SUPPORTED CATALYSTS; TIME-RESOLVED X-RAY ABSORPTION SPECTROSCOPY;

INFRARED SPECTROSCOPY; MASS SPECTROMETRY; PALLADIUM; PRECIOUS METALS; X RAY DIFFRACTION;

ABSORPTION SPECTROSCOPY;

CARBON MONOXIDE; NANOPARTICLE; PALLADIUM; PALLADIUM COMPLEX;

ARTICLE; CATALYSIS; DIFFUSE REFLECTANCE SPECTROSCOPY; MASS SPECTROMETRY; OXIDATION; X RAY ABSORPTION SPECTROSCOPY; X RAY DIFFRACTION;

CARBON MONOXIDE; CATALYSIS; METAL NANOPARTICLES; PALLADIUM; PARTICLE SIZE;

EID: 79953030295     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja110320y     Document Type: Article

References (45)

1. Vennestrom, P. R. N.; Christensen, C. H.; Pedersen, S.; Grundwaldt, J.-D.; Woodley, J. M. ChemCatChem 2010, 2, 249
2. Karimi, B.; Behzadnia, H.; Elhamifar, D.; Akhavan, P. F.; Esfahani, F. K.; Zamani, A. Synthesis 2010, 9, 1399
3. Lamblin, M.; Nassar-Hardy, L.; Hierso, J. C.; Fouquet, E.; Felpin, F.-X. Adv. Synth. Catal. 2010, 352, 33
4. McGlaken, G. P.; Bateninn, L. M. Chem. Soc. Rev. 2009, 38, 2477
5. Xué, L. Q.; Lin, Z. Y. Chem. Soc. Rev. 2010, 39, 1692
6. Alonso, D. A.; Nájera, C. N. Chem. Soc. Rev. 2010, 39, 2891
7. Twigg, M. V. Appl. Catal., B 2007, 70, 2
8. Martínez-Arias, A.; Fernández-García, M.; Conesa, J. C.; Anderson, J. A. In Supported Metal Catalysis; Anderson, J. A.; Fernández-García, M., Eds.; Imperial College Press: Singapore, 2005; Chapter 8.
9. Haaβ, F.; Fuess, H. Adv. Eng. Mater. 2005, 7, 899
10. Trovarelli, A. Catal. Rev.-Sci. Eng. 1996, 38, 97
11. González-Velasco, J. R.; Botas, J. A.; Farret, R.; González-Marcos, M. P.; Marc, J. L.; Gutiérrez-Ortiz, M. A. Catal. Today 2000, 59, 395
12. Wu, X.; Wand, D. Appl. Surf. Sci. 2004, 221, 375
13. Newton, M. A.; Belver-Coldeira, C.; Martínez-Arias, A.; Fernández-García, M. Nat. Mater. 2007, 6, 528
14. Newton, M. A.; Belver-Coldeira, C.; Martínez-Arias, A.; Fernández-García, M. Angew. Chem., Int. Ed. 2007, 46, 8629
15. Newton, M. A.; Di Michiel, M.; Kubacka, A.; Fernández- García, M. J. Am. Chem. Soc. 2010, 132, 4540
16. Kubacka, A.; Martínez-Arias, A.; Fernández-García, M.; Di Michiel, M.; Newton, M. A. J. Catal. 2010, 270, 275
17. Wang, Q.; Zhao, B.; Zhou, R. Environ. Sci. Technol. 2010, 44, 3870
18. Iglesias-Juez, A.; Newton, M. A.; Fiddy, S. G.; Martínez-Arias, A.; Fernández-García, M. Chem. Commun. 2005, 4052
19. Hendriken, B. L. H.; Bobaru, S. C.; Frenken, J. W. M. Top. Catal. 2005, 36, 43
20. Hendriken, B. L. H.; Ackermann, M. D.; van Rijn, R.; Stolz, D.; Popa, I.; Balmes, O.; Resta, A.; Werneille, D.; Felici, R.; Ferrer, S.; Frenken, J. W. M. Nat. Chem. 2010, 2, 730
21. van Rijn, R.; Balmes, O.; Felici, R.; Gustafson, J.; Wermeille, D.; Westerton, R.; Lundgren, E.; Frenken, J. W. M. J. Phys. Chem. C 2010, 114, 6875
22. Gao, F.; Wang, Y.; Goodman, D. W. J. Phys. Chem. C 2009, 113, 174
23. Gao, F.; Cai, Y.; Gath, K. K.; Wang, Y.; Chen, M. S.; Guo, Q. L.; Goodman, D. W. J. Phys. Chem. C 2009, 113, 182
24. McClure, J.; Goodman, D. W. Chem. Phys. Lett. 2009, 469, 1
25. Weckhuysen, B. M. Angew. Chem., Int. Ed. 2009, 48, 4910
26. Tinnemans, S. J.; Mesu, J. G.; Kervinen, K.; Visser, T.; Nijhuis, T. A.; Beale, A. M.; Keller, D. E.; van der Eerden, A. M. J.; Weckhuysen, B. M. Catal. Today 2006, 113, 3
27. Labiche, J.-C.; Mathon, O.; Pascarelli, S.; Newton, M. A.; Guilera Ferre, G.; Cuifs, G.; Vaughan, G.; Homs, A.; Fernandez Carreiras, D. Rev. Sci. Instrum. 2007, 78, 091301
28. Fernández-García, M.; Márquez, C.; Haller, G. L. J. Phys. Chem. 1995, 99, 12565
29. Fernández-García, M. Catal. Rev.-Sci. Eng. 2002, 44, 52
30. Malinoswky, E. R. Factor Analysis in Chemistry; Wiley: New York, 2002.
31. Fernández-García, M.; Iglesias-Juez; Martínez-Arias, A.; Hungría, A. B.; Anderson, J. A.; Conesa, J. C.; Soria, J. J. Catal. 2004, 221, 594
32. Binsted, N. EXCURV, CCLRC Daresbury Laboratory computer programme, 1998.
33. Daniels, J. E.; Drakopoulos, M. J. Synchrotron Radiat. 2009, 16, 463
34. Shannon, R. D.; Rogers, D. B. Inorg. Chem. 1971, 10, 713
35. Agostini, G.; Pellegrini, R.; Leofanti, G.; Birtinetti, L.; Bertarione, S.; Groppo, A.; Lamberti, C. J. Phys. Chem. C 2009, 113, 10485
36. Jentys, A. Phys. Chem. Chem. Phys. 1999, 1, 4059
37. A note can be added in comparing particle size measured with EXAFS and the more usual TEM technique. We have previously made comparisons during similar (to current ones) CO/NO cycling treatments and found that EXAFS estimation of the particle size can be significantly smaller with respect to those obtained using TEM. TEM yields average particle size estimations of 2.5-3 nm for the 2Pd sample and 3.5-4 nm for the 4Pd case (see ref 2f for further details). However, trends as a function of the Pd loading would be roughly consistent among both techniques if we consider that metal particles below 1 nm likely escape TEM detection. This fact, on the other hand, infers that the difference between EXAFS and TEM measurements has an inherent size-dependence in the size range explored in this work. HXRD may generate an additional estimation of primary particle size. In this case, due to the dynamic, high temperature, in operando experimental conditions, we were unable to adequately handle strain and/or the influence of absorbates in size measurements using either the width and/or the position (d -spacing) of HXRD peaks.
38. Matsuma, D.; Okajima, Y.; Nishihata, Y.; Mizuki, J.; Taniguchi, M.; Uenishi, M.; Tanaka, H. J. Phys.: Conf. Ser. 2009, 190, 012154
39. Matsuma, D.; Nishihata, Y.; Mizuki, J.; Taniguchi, M.; Uenishi, M.; Tanaka, H. J. Appl. Phys. 2010, 107, 124319
40. Bensalem, A.; Muller, J. E.; Tessier, D.; Bozon-Verduraz, F. J. Chem. Soc., Faraday Soc. 1996, 92, 3233
41. Iglesias-Juez, A.; Martínez-Arias, A.; Fernández- García, M. J. Catal. 2004, 221, 148
42. Lamberti, C.; Zecchina, A.; Groppo, E.; Bordiga, S. Chem. Soc. Rev. 2010, 39, 4951
43. EXAFS particle size allows an estimation (according to procedures thoroughly described in ref 12 and as it has been exemplified in ref 2f) of the metal dispersion, being 70%/46% for, respectively, 2Pd/4Pd samples. If we arbitrarily add 1 nm to the sizes measured by EXAFS to roughly account for the technique underestimation of the observable, we found a 48%/35% dispersion for, respectively, 2Pd/4Pd samples. Considering the metal loading of each sample, these values give the mentioned difference of ca. 30% (EXAFS size) or 45% (EXAFS size plus 1nm) in (gas phase) available noble metal surface area. So, an estimation of a 30% difference seems conservative for our purposes.
44. Libuda, J.; Freund, H.-J. Surf. Sci. Rep. 2005, 57, 157
45. Schalow, T.; Brandt, B.; Starr, D. E.; Laurin, M.; Shaikhtudinov, S. K.; Schauermann, S.; Libuda, J.; Freund, H.-J. Phys. Chem. Chem. Phys. 2007, 9, 1347