Particle learning of gaussian process models for sequential design and optimization

Journal of Computational and Graphical Statistics

Volumn 20, Issue 1, 2011, Pages 102-118

  Gramacy, Robert B ^a   Polson, Nicholas G ^b  

^a UNIVERSITY OF CHICAGO   (United States)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

Entropy; Expected improvement; Nonparametric regression and classification; Sequential Monte Carlo

Indexed keywords

EID: 79952811240     PISSN: 10618600     EISSN: None     Source Type: Journal    
DOI: 10.1198/jcgs.2010.09171     Document Type: Article

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