Spectral polarimetry technique as a complementary tool to ellipsometry of dielectric films

Applied Optics

Volumn 50, Issue 9, 2011, Pages

  Pereira, Marcelo B ^a   Barreto, Bruno J ^a   Horowitz, Flavio ^a  

^a FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC FILMS; DISPERSIONS; POLARIMETERS; THIN FILMS;

COATING CHARACTERIZATIONS; COMPLEMENTARY TOOLS; MULTIPLE SOLUTIONS; OPTICAL TECHNIQUE; PHYSICAL THICKNESS; RELIABILITY OF RESULTS; SPECTRAL ELLIPSOMETRY; THICKNESS DETERMINATION;

ELLIPSOMETRY;

EID: 79952777396     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.50.00C420     Document Type: Article

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