Direct observation by laser scanning confocal microscopy of microstructure and phase migration of PVC gels in an applied electric field

Langmuir

Volumn 27, Issue 3, 2011, Pages 1207-1211

  Xia, Hong ^a   Ueki, Takamitsu ^a   Hirai, Toshihiro ^a  

^a SHINSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED ELECTRIC FIELD; ATTRACTION FORCE; DC VOLTAGE; DEFORMATION MECHANISM; DIRECT OBSERVATION; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; FLUORESCENT PROBES; IN-SITU; INTERNAL STRUCTURE; LASER SCANNING CONFOCAL MICROSCOPY; LUCIGENIN; PHASE MIGRATION; RICH PHASE; THREE DIMENSIONAL NETWORK STRUCTURE; THREE-DIMENSIONAL INFORMATION;

CHLORINE COMPOUNDS; CONFOCAL MICROSCOPY; ELECTRIC FIELDS; FIELD EMISSION; FIELD EMISSION CATHODES; FIELD EMISSION MICROSCOPES; GELS; POLYMERS; SCANNING; SCANNING ELECTRON MICROSCOPY; THREE DIMENSIONAL;

POLYVINYL CHLORIDES;

EID: 79952755398     PISSN: 07437463     EISSN: 15205827     Source Type: Journal    
DOI: 10.1021/la104031b     Document Type: Article

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