Fast nondeterministic random-bit generation using on-chip chaos lasers

Physical Review A - Atomic, Molecular, and Optical Physics

Volumn 83, Issue 3, 2011, Pages

  Harayama, Takahisa ^a   Sunada, Satoshi ^a   Yoshimura, Kazuyuki ^a   Davis, Peter ^a   Tsuzuki, Ken ^b   Uchida, Atsushi ^c  

^a NTT Corporation   (Japan)

^b NTT CORPORATION   (Japan)

^c SAITAMA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EXTERNAL CAVITY; MONOLITHICALLY INTEGRATED; ON CHIPS; SMALL DEVICES; THEORETICAL MODELS;

LASERS; MONOLITHIC INTEGRATED CIRCUITS; OPTOELECTRONIC DEVICES; STATISTICAL TESTS;

SEMICONDUCTOR LASERS;

EID: 79952730665     PISSN: 10502947     EISSN: 10941622     Source Type: Journal    
DOI: 10.1103/PhysRevA.83.031803     Document Type: Article

References (20)

1. A. J. Menezes, P. C. van Oorschot, and S. A. Vanstone, Handbook of Applied Cryptography (CRC Press, Boca Raton, FL, 1996).
2. N. Metropolis and S. Ulam, J. Am. Stat. Assoc. JSTNAL 0162-1459 10.2307/2280232 44, 335 (1949).
3. S. Asmussen and P. W. Glynn, Stochastic Simulation: Algorithms and Analysis (Springer-Verlag, New York, 2007).
4. C. H. Bennett, J. Cryptology JOCREQ 0933-2790 10.1007/BF00191318 5, 3 (1992).
5. A. Uchida, Nat. Photonics JOCREQ 1749-4885 10.1038/nphoton.2008.227 2, 728 (2008).
6. Thomas E. Murphy and Rajarshi Roy, Nat. Photonics JOCREQ 1749-4885 10.1038/nphoton.2008.239 2, 714 (2008).
7. K. Hirano, IEEE J. Quantum Electron. IEJQA7 0018-9197 10.1109/JQE.2009.2031310 45, 1367 (2009).
8. T. Honjo, Opt. Express OPEXFF 1094-4087 10.1364/OE.17.009053 17, 9053 (2009).
9. I. Reidler, Y. Aviad, M. Rosenbluh, and I. Kanter, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.103.024102 103, 024102 (2009).
10. Ido Kanter, Nat. Photonics PRLTAO 1749-4885 10.1038/nphoton.2009.235 4, 58 (2010).
11. K. Hirano, Opt. Express OPEXFF 1094-4087 10.1364/OE.18.005512 18, 5512 (2010).
12. A. Argyris, M. Hamacher, K. E. Chlouverakis, A. Bogris, and D. Syvridis, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.100.194101 100, 194101 (2008). (Pubitemid 351697474)
13. K. E. Chlouverakis, A. Argyris, A. Bogris, and D. Syvridis, Phys. Rev. E PRLTAO 1539-3755 10.1103/PhysRevE.78.066215 78, 066215 (2008).
14. A. Rukhin, A statistical test suite for random and pseudorandom number generators for cryptographic applications, National Institute of Standards and Technology, Special Publication 800-22 Revision 1a, 2010.
15. G. Marsaglia, in Computer Science and Statistics: The Interface, edited by, L. Billard, (Elsevier, Amsterdam, 1985), p. 3.
16. The software package DIEHARD, a battery of tests of randomness, is available via the WWW at [http://stat.fsu.edu/geo/diehard.html], 1996. The Marsaglia Random Number CDROM contains 4.8109 random bits obtained from a combination of several sources.
17. For example, in the case of the monobit frequency test which tests the ratio of 1 and 0, the statistical significance value α = 0. 01 means that deviation δ from the ideal value of 1/2 should be such that erfc (δ √ 2 n < α, where erfc is the complementary error function and n is the length of the bit sequence).
18. R. Lang and K. Kobayashi, IEEE J. Quantum Electron. IEJQA7 0018-9197 10.1109/JQE.1980.1070479 16, 347 (1980).
19. T. Heil, I. Fischer, W. Elsasser, and A. Gavrielides, Phys. Rev. Lett. PRLTAO 0031-9007 10.1103/PhysRevLett.87.243901 87, 243901 (2001).
20. T. Heil, Phys. Rev. E PRLTAO 1539-3755 10.1103/PhysRevE.67.066214 67, 066214 (2003).