Characteristics of fast physical random bit generation using chaotic semiconductor lasers

IEEE Journal of Quantum Electronics

Volumn 45, Issue 11, 2009, Pages 1367-1379

  Hirano, Kunihito ^a   Amano, Kazuya ^a   Uchida, Atsushi ^b   Naito, Sunao ^a   Inoue, Masaki ^a   Yoshimori, Shigeru ^a   Yoshimura, Kazuyuki ^c   Davis, Peter ^c  

^a TAKUSHOKU UNIVERSITY   (Japan)

^b SAITAMA UNIVERSITY   (Japan)

^c Nippon Telegraph and Telephone Corporation   (Japan)

Author keywords

Chaos; Information technology; Random number generation; Semiconductor laser

Indexed keywords

CHAOS; CHAOTIC LASERS; CHAOTIC OSCILLATION; CHAOTIC SEMICONDUCTOR LASERS; COMMUNICATION APPLICATION; EXCLUSIVE-OR; EXTERNAL CAVITY LENGTH; FEEDBACK STRENGTH; INJECTION CURRENTS; LASER PARAMETERS;

FEEDBACK; INFORMATION TECHNOLOGY; LASER BEAM EFFECTS; LASERS; SEMICONDUCTOR JUNCTIONS; SEMICONDUCTOR LASERS; STATISTICAL TESTS;

RANDOM NUMBER GENERATION;

EID: 77949588001     PISSN: 00189197     EISSN: None     Source Type: Journal    
DOI: 10.1109/JQE.2009.2031310     Document Type: Article

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