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Volumn 13, Issue 12, 2011, Pages 5252-5263

X-ray spectroscopy of electrochemically deposited iridium oxide films: Detection of multiple sites through structural disorder

Author keywords

[No Author keywords available]

Indexed keywords


EID: 79952643184     PISSN: 14639076     EISSN: None     Source Type: Journal    
DOI: 10.1039/c0cp01472a     Document Type: Article
Times cited : (73)

References (41)
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    • B. Lengeler, in Neutron and X-ray Spectroscopy, ed. F. Hippert, E. Geissler, J. L. Hodeau, E. Lelievre-Berna and J. -R. Regnard, Springer, Dordrecht, 2006, ch. 4.
    • (2006) Neutron and X-ray Spectroscopy
    • Lengeler, B.1
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    • 79952671942 scopus 로고    scopus 로고
    • PhD Thesis, University of Leicester
    • M. A. Skopek, PhD Thesis, University of Leicester, 2009.
    • (2009)
    • Skopek, M.A.1
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    • 0006612988 scopus 로고    scopus 로고
    • Accessed 9 Jan. 2010
    • N. Binsted, EXCURV98 Manual, http://www.srs.dl.ac.uk/xrs/ Computing/Programs/excurv97/e61.htm, Accessed 9 Jan. 2010.
    • EXCURV98 Manual
    • Binsted, N.1
  • 37
    • 79952641071 scopus 로고    scopus 로고
    • Accessed 9 Jan. 2010
    • J. F. W. Mosselmans, A Guide to EXCURV98, http://www.srs.dl. ac.uk/xrs/Computing/Programs/excurv97/excurv98guide.htm, Accessed 9 Jan. 2010.
    • A Guide to EXCURV98
    • Mosselmans, J.F.W.1
  • 39
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    • ICSD, Daresbury Laboratory, U.K.
    • ICSD, Chemical database service, Daresbury Laboratory, U.K.
    • Chemical Database Service


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.