Determination of the refractive index of single crystal bulk samples and micro-structures

Thin Solid Films

Volumn 519, Issue 9, 2011, Pages 2777-2781

  Schmidt Grund, R ^a   Kuhne P ^a,b   Czekalla, C ^a   Schumacher, D ^a   Sturm, C ^a   Grundmann, M ^a  

^a UNIVERSITY OF LEIPZIG   (Germany)

^b UNIVERSITY OF NEBRASKA LINCOLN   (United States)

Author keywords

Micro wire; Refractive index; Spectroscopic ellipsometry; Surface potential; Whispering gallery modes; ZnO

Indexed keywords

BAND GAPS; BULK MATERIALS; BULK SAMPLES; COMPARATIVE STUDIES; COMPLEMENTARY METHODS; ENERGY RANGES; MICRO-WIRE; PHYSICAL EFFECTS; REFRACTIVE INDEX DISPERSION; SPATIALLY RESOLVED; SPECTRAL RANGE; TOTAL INTERNAL REFLECTIONS; WHISPERING GALLERY MODES; ZNO;

CRYSTAL STRUCTURE; ELECTROMAGNETIC FIELD EFFECTS; ELECTROMAGNETIC FIELDS; ELECTRONIC PROPERTIES; LIGHT REFRACTION; OPTICAL RESONATORS; PHOTOLUMINESCENCE SPECTROSCOPY; PHOTONIC BAND GAP; PHOTONIC CRYSTALS; REFRACTIVE INDEX; REFRACTOMETERS; SPECTROSCOPIC ELLIPSOMETRY; SURFACE POTENTIAL; SURFACE PROPERTIES; WIRE; ZINC OXIDE;

SINGLE CRYSTALS;

EID: 79952621314     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2010.12.047     Document Type: Article

References (25)

1. D.M. Bagnall, Y.F. Chen, Z. Zhu, T. Yao, S. Koyama, M.Y. Shen, and T. Goto Appl. Phys. Lett. 70 1997 2230
2. D.C. Reynolds, D.C. Look, and B. Jogai Solid State Commun. 99 1996 873
3. Y. Segawa, A. Ohtomo, M. Kawasaki, H. Koinuma, Z. Tang, P. Yu, and G. Wong Phys. Status Solidi, B 202 1997 669
4. C. Czekalla, C. Sturm, R. Schmidt-Grund, B. Cao, M. Lorenz, and M. Grundmann Appl. Phys. Lett. 92 2008 241102
5. K. Bando, T. Sawabe, K. Asaka, and Y. Masumoto J. Lumin. 108 2004 385
6. C. Sturm, H. Hilmer, R. Schmidt-Grund, and M. Grundmann New J. Phys. 11 2009 073044
7. Z.L. Wang Mater. Today 7 2004 26
8. R. Schmidt-Grund, H. Hilmer, A. Hinkel, C. Sturm, B. Rheinländer, V. Gottschalch, M. Lange, J. Zúñiga-Pérez, and M. Grundmann Phys. Status Solidi, B 247 2010 1351
9. S. Graubner, C. Neumann, N. Volbers, B.K. Meyer, J. Bläsing, and A. Krost Appl. Phys. Lett. 90 2007 042103
10. N.Y. Garces, N.C. Giles, L.E. Halliburton, G. Cantwell, D.B. Eason, D.C. Reynolds, and D.C. Look Appl. Phys. Lett. 80 2002 1334
11. A. Kobayashi, S. Kawano, Y. Kawaguchi, J. Ohta, and H. Fujioka Appl. Phys. Lett. 90 2007 041908
12. M. Schubert H. Thompkins, E.A. Irene, Handbook of Ellipsometry 2004 William Andrew Publishing Highland Mills
13. H. Yoshikawa, and S. Adachi Jpn. J. Appl. Phys. 36 1997 6237
14. W.Y. Liang, and A.D. Yoffe Phys. Rev. Lett. 20 1968 59
15. M. Lorenz, J. Lenzner, E. Kaidashev, H. Hochmuth, and M. Grundmann Ann. Phys. 13 2004 39
16. B.Q. Cao, M. Lorenz, M. Brandt, H. von Wenckstern, J. Lenzner, G. Biehne, and M. Grundmann Phys. Status Solidi (RRL) 2 2008 37
17. C. Czekalla, T. Nobis, A. Rahm, B. Cao, J. Zúñiga- Pérez, C. Sturm, R. Schmidt-Grund, M. Lorenz, and M. Grundmann Phys. Status Solidi, B 247 2010 1282
18. T. Nobis, E.M. Kaidashev, A. Rahm, M. Lorenz, and M. Grundmann Phys. Rev. Lett. 93 2004 103903
19. T. Nobis, and M. Grundmann Phys. Rev. A 72 2005 063806
20. J. Wiersig Phys. Rev. A 67 2003 023807
21. V. Travnikov, A. Freiberg, and S. Savikhin J. Lumin. 47 1990 107
22. L. Wischmeier, T. Voss, S. Börner, and W. Schade Appl. Phys. A 84 2006 111
23. L. Wischmeier, T. Voss, I. Rückmann, and J. Gutowski Phys. Rev. B 74 2006 195333
24. J. Richters, T. Voss, D. Kim, R. Scholz, and M. Zacharias Nanotechnology 19 2008 305202
25. R.M.A. Azzam, and N.M. Bashara Ellipsometry and Polarized Light 1984 North-Holland Amsterdam