Determination of relative sensitivity factors for trace element analysis of solar cell silicon by fast-flow glow discharge mass spectrometry

Spectrochimica Acta - Part B Atomic Spectroscopy

Volumn 66, Issue 2, 2011, Pages 144-148

  Di Sabatino, Marisa ^a,b   Dons, Anne L ^b   Hinrichs, Joachim ^c   Arnberg, Lars ^a  

^a NORWEGIAN UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Norway)

^b SINTEF   (Norway)

^c THERMO FISHER SCIENTIFIC   (Germany)

Author keywords

Mass spectrometry; Relative sensitivity factors; Silicon; Trace elements

Indexed keywords

ANALYTICAL METHOD; FAST-FLOW GLOW DISCHARGES; GAS FLOWRATE; GLOW DISCHARGE MASS SPECTROMETRY; IMPURITIES IN; INSTRUMENTAL PARAMETERS; MATRIX; METALLIC CONDUCTOR; PHOTOVOLTAIC APPLICATIONS; QUANTITATIVE ANALYSIS; RELATIVE SENSITIVITY FACTOR; REPRODUCIBILITIES; SILICON MATERIALS; SILICON MATRIX; SOLAR CELL SILICON; TRACE ELEMENT ANALYSIS; TUNING PARAMETER;

AGRICULTURAL CHEMICALS; GLOW DISCHARGES; IMPURITIES; MASS SPECTROMETRY; SOLAR CELLS; TRACE ANALYSIS;

TRACE ELEMENTS;

EID: 79952572699     PISSN: 05848547     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.sab.2011.01.004     Document Type: Article

References (13)

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