Diagnosis of process faults and sensor faults in a class of nonlinear uncertain systems

Journal of Systems Engineering and Electronics

Volumn 22, Issue 1, 2011, Pages 22-32

  Zhang, Xiaodong ^a   Zhang, Qi ^a   Sonti, Niharika ^a  

^a Wright State University   (United States)

Author keywords

Fault detectability; Fault detection; Fault isolation; Process faults; Robustness; Sensor bias

Indexed keywords

DETECTABILITY; FAULT ISOLATION; PROCESS FAULTS; ROBUSTNESS; SENSOR BIAS;

ELECTRIC FAULT CURRENTS; PATTERN RECOGNITION SYSTEMS; SENSORS; UNCERTAIN SYSTEMS;

FAULT DETECTION;

EID: 79952554622     PISSN: 10044132     EISSN: None     Source Type: Journal    
DOI: 10.3969/j.issn.1004-4132.2011.01.003     Document Type: Article

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