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Applied Surface Science

Volumn 257, Issue 13, 2011, Pages 5657-5662

Structural, optical and electrical properties of Zn 1-x Cd x O thin films prepared by PLD

(4) Zheng, B J a Lian, J S a Zhao, L a Jiang, Q a

a Jilin University (China)

Author keywords

Hall effect; Pulse laser deposition; Transparent conductor oxide

Indexed keywords

ATOMIC FORCE MICROSCOPY; ENERGY GAP; HALL EFFECT; OPTICAL DATA PROCESSING; OPTOELECTRONIC DEVICES; SEMICONDUCTOR ALLOYS; SEMICONDUCTOR LASERS; SEMICONDUCTOR QUANTUM WELLS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION; ZINC SULFIDE;

C-AXIS ORIENTATIONS; OPTICAL AND ELECTRICAL PROPERTIES; OPTICAL MEASUREMENT; PULSE LASER DEPOSITION; SEMICONDUCTOR FILMS; TRANSPARENT CONDUCTOR OXIDE; WURTZITE STRUCTURE; X-RAY DIFFRACTION MEASUREMENTS;

ZINC ALLOYS;

EID: 79952533122 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2011.01.070 Document Type: Article

Times cited : (45)

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