Quartz roughness affect on W03 coated QCM

Journal of Physics: Conference Series

Volumn 253, Issue 1, 2010, Pages

  Georgieva, V ^a   Raicheva, Z ^a   Grechnikov, A ^b   Gadjanova, V ^b   Atanassov, M ^a   Lazarov, J ^a   Manolov, E ^a  

^a INSTITUTE OF SOLID STATE PHYSICS   (Bulgaria)

^b VERNADSKY INSTITUTE OF GEOCHEMISTRY AND ANALYTICAL CHEMISTRY   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

MOLECULAR ELECTRONICS; QUARTZ; QUARTZ CRYSTAL MICROBALANCES; SCANNING ELECTRON MICROSCOPY; SILICON CARBIDE; SORPTION;

AT-CUT QUARTZ CRYSTALS; CROSS-SECTION PROFILE; DYNAMIC PARAMETERS; DYNAMIC RESISTANCE; QUALITY FACTORS; ROUGHNESS CHANGE; SORPTION ABILITY; SORPTION PROPERTIES;

SURFACE ROUGHNESS;

EID: 79952418382     PISSN: 17426588     EISSN: 17426596     Source Type: Conference Proceeding    
DOI: 10.1088/1742-6596/253/1/012046     Document Type: Conference Paper

References (11)

1. Burlachenko J, Savchenko A, Shirshov Y, Kukla O, Kruglenko I and Belyaev O 2009 Procedia Chem. 1 301
2. Kim D, Noh J, Hara M and H Lee 2001 Bull. Korean Chem. Soc. 22 276
3. Mérian T, Debarnot D, Rouessac V and Poncin-Epaillarda F 2010 Talanta 81 602
4. Ohira S, Wanigasekara E, Rudkevich D and Dasgupta P 2009 Talanta 77 1814
5. Zhao Y, He J, Yang M, Gao S, Zuo G, Yan C and Cheng Z 2009 Analytica Chimica Acta 654 120
6. Wang X, Zhang J and Zhu Z 2006 Appl. Surf. Sci. 252 2404
7. Banerjee D, Lao J, Wang D, Huang J, Ren Z, Steeves D, Kimball B and Sennett M Appl. Phys. Lett. 83 2061
8. Sung W, Sung J and Lee S 2005 Phys. Rev. E 71 031805
9. Manolov S and Tihchev H 1982 Generators (Sofia Tehnika)
10. Georgieva V, Stefanov P, Spassov L, Raicheva Z, Atanasov M and Tincheva T 2009 J. Optoel. Adv. Mater. 11 1363
11. Sauerbrey G 1959 Z. Phys. 155 206