Structural characterization of Pb nanoislands in SiO2/Si interface synthesized by ion implantation through MEIS analysis

Surface Science

Volumn 605, Issue 7-8, 2011, Pages 654-658

  Sanchez, D F ^a   Luce, F P ^a   Fabrim, Z E ^a   Sortica, M A ^a   Fichtner, P F P ^a   Grande, P L ^a  

^a FEDERAL UNIVERSITY OF RIO GRANDE DO SUL   (Brazil)

Author keywords

Lead, Nanoparticles; Medium energy ion scattering (MEIS); Transmission electron microscopy (TEM)

Indexed keywords

AREAL DENSITIES; GEOMETRICAL SHAPES; MEDIUM ENERGY ION SCATTERING; MICROSTRUCTURAL INFORMATION; MONTE CARLO; NANO-ISLANDS; SI FILMS; STRUCTURAL CHARACTERIZATION; TEM; TWO-DIMENSIONAL ARRAYS;

ION IMPLANTATION; LEAD; NANOPARTICLES; PLASMA INTERACTIONS; SCATTERING; SILICON COMPOUNDS; TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 79952364420     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2010.12.011     Document Type: Article

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