Signature and IFR preservation of 2-within-consecutive κ-out-of-n: F Systems

IEEE Transactions on Reliability

Volumn 60, Issue 1, 2011, Pages 315-322

  Triantafyllou, Ioannis S ^a   Koutras, Markos V ^a  

^a UNIVERSITY OF PIRAEUS   (Greece)

Author keywords

2 within consecutive out of n: F system; Increasing failure rate; Samaniego's signature; stochastic order

Indexed keywords

CONSECUTIVE-K-OUT-OF-N; EXACT FORMULAS; F SYSTEM; INCREASING FAILURE RATE; PROPERTY PRESERVATION; RECURRENCE RELATIONS; SAMANIEGO'S SIGNATURE; STOCHASTIC COMPARISONS; STOCHASTIC ORDER; STOCHASTIC ORDERINGS;

STOCHASTIC SYSTEMS;

EID: 79952195670     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2011.2105000     Document Type: Article

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