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Volumn 55, Issue 3, 2006, Pages 535-541

Some aging properties of the residual life of k-out-of-n systems

Author keywords

Hazard rate order; Increasing failure rate; Likelihood ratio order; New better than used; Stochastic order

Indexed keywords

FAILURE ANALYSIS; FAULT TOLERANCE; MAXIMUM LIKELIHOOD ESTIMATION;

EID: 34047271086     PISSN: 00189529     EISSN: None     Source Type: Journal    
DOI: 10.1109/TR.2006.879652     Document Type: Article
Times cited : (64)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.