White-light spectral interferometry for surface plasmon resonance sensing applications

Optics Express

Volumn 19, Issue 5, 2011, Pages 4521-4527

  Ng, Siu Pang ^a   Wu, Chi Man Lawrence ^a   Wu, Shu Yuen ^b   Ho, Ho Pui ^b  

^a CITY UNIVERSITY OF HONG KONG   (Hong Kong)

^b CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

INTERFEROMETRY; LIGHT SOURCES; OPTIMIZATION; PLASMONS; REFRACTIVE INDEX; SENSORS; SODIUM; SODIUM CHLORIDE;

COUPLING WAVELENGTHS; DETECTION LIMITS; DIFFERENTIAL PHASE; EXTENDED DYNAMICS; FIXED ANGLES; IN-PHASE; OPTIMAL SENSITIVITY; PHASE CHANGE; PHASE DETECTING; SENSING APPLICATIONS; SODIUM CHLORIDE SOLUTION; SPR EXCITATION; SURFACE PLASMON RESONANCE SENSING; SURFACE PLASMON RESONANCE SENSOR; VISIBLE SPECTRA; WHITE LIGHT SOURCES; WHITE-LIGHT SPECTRAL INTERFEROMETRY;

SURFACE PLASMON RESONANCE;

ARTICLE; EQUIPMENT; EQUIPMENT DESIGN; INSTRUMENTATION; INTERFEROMETRY; LIGHT; SPECTROSCOPY; SURFACE PLASMON RESONANCE; TRANSDUCER;

EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; INTERFEROMETRY; LIGHT; SPECTRUM ANALYSIS; SURFACE PLASMON RESONANCE; TRANSDUCERS;

EID: 79952128474     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.19.004521     Document Type: Article

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