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Volumn , Issue , 2010, Pages 565-567

Logic gate implementations for quantum dot cellular automata

Author keywords

[No Author keywords available]

Indexed keywords

ADVANCED TECHNOLOGY; CMOS TRANSISTORS; COMPUTING ARCHITECTURE; FAN OUT; FULL ADDERS; HALF ADDER; IMPLEMENTATION PROCESS; MAJORITY GATES; NANO SCALE; NANOMAGNETS; QUANTUM DEVICE; QUANTUM DOT; QUANTUM DOT CELLULAR AUTOMATA; SINGLE DOMAINS;

EID: 79952087487     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CICN.2010.111     Document Type: Conference Paper
Times cited : (9)

References (6)
  • 3
    • 2342652909 scopus 로고    scopus 로고
    • Incorporating standard CMOS design process methodologies into the QCA logic design process
    • march
    • S.C. Henderson, E.W. Johnson, J.R. Janulis, and P.D. Tougaw, "Incorporating standard CMOS design process methodologies into the QCA logic design process". IEEE Tranactions on nanotechnology, vol. 3 no. 1, pp. 2-9, march 2004.
    • (2004) IEEE Tranactions on Nanotechnology , vol.3 , Issue.1 , pp. 2-9
    • Henderson, S.C.1    Johnson, E.W.2    Janulis, J.R.3    Tougaw, P.D.4
  • 4
    • 50249163627 scopus 로고    scopus 로고
    • Logic optimization for majority gate-based nanoelectronic circuits
    • May
    • Z. Huo Q. Zhang. S. Haruehanroengra, and W. Wang, "Logic optimization for majority gate-based nanoelectronic circuits." Circuits and Systems, p. 4 pp., May 2006.
    • (2006) Circuits and Systems , pp. 4
    • Huo, Z.1    Zhang, Q.2    Haruehanroengra, S.3    Wang, W.4
  • 6
    • 33646918309 scopus 로고    scopus 로고
    • Towards designing robust QCA architectures in the presence of sneak noise paths
    • DOI 10.1109/DATE.2005.316, 1395759, Proceedings - Design, Automation and Test in Europe, DATE '05
    • K. Kim, K. Wu, and R. Karri, "Towards designing robust QCA architectures in the presence of sneak noise paths." in Proceedings of the Design, Atomation and Test in Europe Conference and Exhibition, vol. 2. IEEE Computer Society, 2005, pp. 1214-1219 (Pubitemid 44172175)
    • (2005) Proceedings -Design, Automation and Test in Europe, DATE '05 , vol.II , pp. 1214-1219
    • Kim, K.1    Wu, K.2    Karri, R.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.