Tip enhanced Raman scattering with adiabatic plasmon focusing tips

Micron

Volumn 42, Issue 4, 2011, Pages 313-317

  Bek, Alpan ^a   De Angelis, Francesco ^b,c   Das, Gobind ^c   Di Fabrizio, Enzo ^b,c   Lazzarino, Marco ^a,d  

^a CBM scrl Area Science Park Basovizza   (Italy)

^b UNIVERSITY MAGNA GRAECIA OF CATANZARO   (Italy)

^c ISTITUTO ITALIANO DI TECNOLOGIA   (Italy)

^d IOM CNR LABORATORIO TASC   (Italy)

Author keywords

Adiabatic plasmon focusing; Atomic force microscopy; Surface plasmon polariton; Tip enhanced Raman spectroscopy

Indexed keywords

ADIABATIC-PLASMON-FOCUSING; AFM; AFM IMAGING; ATOMIC FORCE MICROSCOPE CANTILEVERS; ENHANCED RAMAN SCATTERING; HIGH RESOLUTION; MICROSCOPY TECHNIQUE; NEAR FIELDS; PHOTON CONFINEMENT; PLASMONIC WAVEGUIDES; RADIUS OF CURVATURE; RAMAN EXCITATION; REPRODUCIBILITIES; RESEARCH GROUPS; SPATIAL RESOLUTION; SURFACE-PLASMON-POLARITON; TIP-ENHANCED-RAMAN-SPECTROSCOPY;

ATOMIC SPECTROSCOPY; CHEMICAL ANALYSIS; FOCUSING; LASER EXCITATION; PHONONS; PHOTONIC CRYSTALS; PHOTONS; QUANTUM THEORY; RAMAN SCATTERING; RAMAN SPECTROSCOPY; SILICON NITRIDE; WAVEGUIDES;

PLASMONS;

EID: 79952041159     PISSN: 09684328     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.micron.2010.05.017     Document Type: Article

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