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Volumn 317, Issue 1, 2011, Pages 32-38
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Crystal growth and perfection of large octahedral synthetic diamonds
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Author keywords
A1. Etching; A1. Line defects; A1. Planar defects; A2. Single crystal growth; B1. Diamond
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Indexed keywords
A1. ETCHING;
A1. PLANAR DEFECTS;
AVERAGE RATE;
B1. DIAMOND;
DIAMOND CRYSTALS;
DISLOCATION-FREE;
EXTENDED DEFECT;
GROWTH SECTORS;
GROWTH STEPS;
LINE DEFECTS;
MIXED DISLOCATION;
PARTIAL DISLOCATIONS;
PLANAR DEFECT;
SEED CRYSTAL;
SELECTIVE ETCHING;
TEMPERATURE GRADIENT METHOD;
TWO-DIMENSIONAL NUCLEATION;
X-RAY DIFFRACTION TOPOGRAPHY;
CRYSTAL GROWTH;
CRYSTALLIZATION;
DEFECTS;
DIAMONDS;
ETCHING;
GRADIENT METHODS;
SCREW DISLOCATIONS;
SINGLE CRYSTALS;
STACKING FAULTS;
SYNTHETIC DIAMONDS;
X RAY DIFFRACTION;
EDGE DISLOCATIONS;
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EID: 79952038228
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/j.jcrysgro.2011.01.011 Document Type: Article |
Times cited : (29)
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References (31)
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