Crystalline perfection of high purity synthetic diamond crystal

Journal of Crystal Growth

Volumn 178, Issue 4, 1997, Pages 485-494

  Sumiya, H ^a   Toda, N ^a   Nishibayashi, Y ^a   Satoh, S ^a  

^a SUMITOMO ELECTRIC INDUSTRIES LTD   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL GROWTH; CRYSTAL IMPURITIES; CRYSTALLINE MATERIALS; OPTICAL MICROSCOPY; RAMAN SPECTROSCOPY; STRAIN; THERMAL GRADIENTS; X RAY CRYSTALLOGRAPHY;

DOUBLE CURVE X RAY ROCKING CURVE MEASUREMENT; POLARIZING MICROSCOPY; X RAY TOPOGRAPHY;

SYNTHETIC DIAMONDS;

EID: 0031176629     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(96)00797-X     Document Type: Article

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