Electric field and size effects on atomic structures and conduction properties of ultrathin Cu nanowires

Journal of Physical Chemistry C

Volumn 115, Issue 8, 2011, Pages 3327-3331

  He, Cheng ^a   Zhang, Wenxue ^b   Deng, Juanli ^b,c  

^a XI'AN JIAOTONG UNIVERSITY   (China)

^b CHANG'AN UNIVERSITY   (China)

^c NORTHWESTERN POLYTECHNICAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC STRUCTURE; BALLISTIC TRANSPORTS; CHARGE PROPERTIES; CONDUCTION CHANNEL; CONDUCTION PROPERTIES; CU NANOWIRES; DENSITY-FUNCTIONAL CALCULATIONS; FUTURE APPLICATIONS; SIZE EFFECTS; SIZE RANGES; ULTRA-THIN; WIRE DIAMETER;

ATOMS; BALLISTICS; ELECTRIC FIELDS; ELECTRIC WIRE; MICROELECTRONICS; NANOWIRES; TRANSPORT PROPERTIES;

ELECTRIC PROPERTIES;

EID: 79952025920     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp1119876     Document Type: Article

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