Preparation and characterization of nanocrystalline CdSe thin films deposited by SILAR method

Materials Chemistry and Physics

Volumn 78, Issue 1, 2003, Pages 11-14

  Pathan, H M ^a   Sankapal, B R ^b   Desai, J D ^c   Lokhande, C D ^a  

^a SHIVAJI UNIVERSITY   (India)

^b HAHN MEITNER INSTITUT   (Germany)

^c S S G M College   (India)

Author keywords

CdSe; Nanocrystalline thin film; SILAR method

Indexed keywords

CADMIUM COMPOUNDS; CONCENTRATION (PROCESS); ELECTRIC CONDUCTIVITY; ENERGY DISPERSIVE SPECTROSCOPY; GLASS; HIGH RESOLUTION ELECTRON MICROSCOPY; LIGHT ABSORPTION; NEGATIVE IONS; OPTIMIZATION; PH EFFECTS; POSITIVE IONS; THIN FILMS; X RAY ANALYSIS; X RAY DIFFRACTION;

CHEMICAL BATH DEPOSITION (CBD);

NANOSTRUCTURED MATERIALS;

EID: 0037415197     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(02)00198-0     Document Type: Article

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